Lab. Location:Engineering Building III 111B
Lab. Ext:
Lab. Website :
Administrator : Prof. Chih-Fang Huang |
| Wide Bandgap Semiconductor Research Facilities |
| Hot chuck (Instec HCC601-STC20A) |
| Multimeter (Keithley Model 2000) |
| 1700C Tube furnace |
| RTA (ULVAC MILA-3000) (Lindberg/Blue) |
| Semiconductor parameter analyzer (HP 4145B) |
| Dual-channel system source meter instru. (Keithley 2602 SMU) |
| High0voltage supply (Keithley Model 248) |
|
Lab. Location:Education Building R111
Lab. Ext:34034
Lab. Website : Microelectronics Lab.
Administrator : Prof. Ya-Chin King |
system and Probe station
| A‧Universal device transfer function system and Probe station |
| Semiconductor Parameter Analyzer |
HP4145B |
| Precision Semiconductor Parameter Analyzer |
HP4142A |
| Module DC Source/Monitor |
HP4156A |
| Source/Monitor Unit |
HP41421B |
| 50MHz Dual Channel Pulse Generator |
HP8115A |
| 150MHz Dual Channel Pulse Generator |
HP8110A |
| 100V/2A Pulse Generator |
HP8114A |
| Digitizing Oscilloscope |
HP54504A |
| 20Hz~1MHz Precision LCR Meter |
HP4284A |
| PA Meter/DC Source |
HP4140B |
| SMU and Pulse Generator Expander |
HP41501A |
| B‧High-power device analyzing system and Probe station |
| High Current Source/Monitor Unit |
HP41422A |
| High Voltage Source/Monitor Unit |
HP41423A |
| Power Generator |
GPR-3010HD |
| 100V/2A Pulse Generator |
HP8114A |
| 150MHz Dual Channel Pulse Generator |
HP8110A |
| Semiconductor Parameter Analyzer |
HP4145B |
| Digitizing Oscilloscope |
HP54504A |
| C‧Flash memory device analyzing system and Probe station |
| 50MHz Dual Channel Pulse Generator |
HP8115A |
| 150MHz Dual Channel Pulse Generator |
HP8110A |
| Digitizing Oscilloscope |
HP54504A |
| Module DC Source/Monitor |
HP4142A |
| Source/Monitor Unit |
HP41421B |
| Switch/Control Unit |
HP3488A |
| Switch Matrix |
HP44473A |
| D‧Photo sensing device analyzing system and Probe station |
| 50MHz Dual Channel Pulse Generator |
HP8115A |
| Digitizing Oscilloscope |
HP54504A |
| Switch/Control Unit |
HP3488A |
| Precision Semiconductor Parameter Analyzer |
HP4156A |
| 100V/2A Pulse Generator |
HP8114A |
| Autoranging Picoammeter |
KIETHLEY 485 |
| SMU and Pulse Generator Expander |
HP41501A |
| Power Generator |
GPR-3010HD |
|
Lab. Location:Engineering Building III 301
Lab. Ext:34050
Lab. Website : Nanoelectronics Lab.
Administrator : Prof. Po-Wen Chiu |
|

Lab. Location:Education Building 111
Lab. Ext:34107
Lab. Website : NeuroEngineering Lab.
Administrator : Prof. Hsin Chen |
| NeuroEngineering Research Facilities |
| Mixed-Signal Oscilloscope |
| Analog Oscilloscope |
| Arbitrary Waveform Generators |
| Power Supply |
| DELL Instrument Control Workstation |
| Multi-Function DAQ Card |
| Analog Probe |
| Digital Probe |
|
CMOS MEMS Lab.
Lab. Location:Education Building 111
Lab. Ext:
Lab. Website :
Administrator : Prof. Shiang-Cheng Lu |
| CMOS-MEMS Research Facilities |
| Probe station |
| HP 4395A Spectrum/Network Analyzer |
| Lock-in Amplifier (Stanford Research SR844) |
| Nanovoltmeter (Keithley 2182A) |
| pA current meter (Keithley 6514) |
| Digial oscilloscope (Agilent DSO 5014A) |
| Digital Multimeter (Agilent 33401A) |
|
| Amorphous Semicouductors Lab. |
- PC-486
- PC-586
- HP laser printer
- HP deskjet
|
| Low-Dimensional Device Physics and Ultrafast Lab. |
- Spectral Physics Tsunami pulsed Ti:sapphire
- Coherent Innova 400
- Coherent 890,Ti:sapphire,WaveScan
- JEOL 840A
- Raith Proxy Writer
|
| High Frequency Measurement |
- HP8510C
- HP8517B Frequency Syntheizer
- HP4142 Power Supply
- HP Test Set
- HP Workstation
- High-f IC-CAP Software
- Summit 9000 Probe Station
- HP 84124A Oscilloscope
- PSPL 4015C Pulse Generato
|
| Game Lab. |
- PECVD
- ECR-CVD, and thin film fabrication facilities
- E-beam lithography and complete facilities for submicron device fabrication
- HREEL and bulk and surface analyzing facilities
|
| Micro-Electro-Mecha-Optical System (MEMOS) Lab. |
- Standard Microelectronics Processing Equipment
- MEMS Special Processing Equipment
|
| Semiconductor Device & Processes Lab. |
- Vacuum furnace
- HP 4140B
- Infarad gold image furnace
- LPCVD(Low pressure chemical vapor deposition)--Deposition of AL & TiN
- LPCVD(Low pressure chemical vapor deposition)--Deposition of TaN
- Vacuum sputter system
- Personal Computers
|
| Noisy Measurement Lab. |
- I-V measurement systems
- Shielded Rood
- PC586, PC686
- Sun Spark5
|
| Microelectronic Devices and Matrials Lab. |
- RF magnetron sputtering system
- Plasma enhanced chemical vapor deposition(PECVD) system
- I-V test system
- C-V test system
- Low temperature measurement system
- Anneling furnace
- Personal computer
|
| Epitaxy and Optoelectronic Devices Lab. |
- Liquid-phase epitaxy
- Rapid thermal annealing
- Optical microscope
- HP4156 parameter analysis
- HP4280 capacitance-voltage meter
- Photoluminescence (in Room:117 Engineering III Building)
|
| Semiconductor Physics and Devices Simulation Lab. |
- HP 9000/720 Workstation
- IBM 6000/320
- SUN 4/60
- HP laser printers X 2
- MP plotter
- Personal Computers
- SUN ELC
- DEC 3000
|
| Laser Characteristice and Applications Lab. |
- RF Power generators
- RF Spectrum analyzer
- Digitizing oscilloscope
- RF-excited CO2 laser
- Laser cooling circulator
- 2.0um DFB laser diode
- Laser diode driver and temperature controller
- Grating spectrumeter
- Laser spectrum analyzer
- High Voltage power supply
- Lock-in amplifier
- Boxcer integrator
- Optical chopper
- PC-486
- PC-586
- Vacuum system and gauge
|